S. Mohapatra, S. R. Barik, D. Panigrahi and S. K. Pradhan
ICAR-National Rice Research Institute, Cuttack-753 004 (Odisha), India
*(e-mail : pradhancrri@gmail.com; Mobile : 9337900409)
(Received : July 26, 2020; Accepted : September 18, 2020)
ABSTRACT
The effect of high temperature stress in rice reduces rice yield drastically. It produces more chaffy grains. The present investigation aimed at assessing the statistical and genetic parameters of traits in a set of rice germplasm lines under high temperature stress. One hundred and eighty early duration germplasm lines were delayed sown to develop a panel population based on spikelet fertility. Genetic variability, heritability, genetic advance in yield related traits like panicle length, panicle neck length, panicle exsertion, spikelet fertility, days to 50% flowering and 1000-grain weight exhibited variation in the studied panel population set under high temperature stress and normal condition. The germplasm lines, namely, N 22, Annapurna, Dular, IR 83373-B-B-24-4, Wita-12, CR 2599-2, IR 88836-4-1-3-2, IR 88963-31-6-1-1-IRRI, IR 84899-B183-6-1-1-2 and IR 84887-B-157-38-1-1-3 were identified as tolerant to high temperature stress. Thirty SSR markers linked to high temperature stress tolerance were validated for their use in stress tolerance breeding programmes. Molecular markers RM 314, RM 225, RM 566, RM 242, RM 547, RM 212, RM 209
and INDEL 5 were found to differentiate the panel population under high temperature stress. These markers were useful in the marker-assisted breeding programmes for high temperature stress tolerance in rice.
Key words : : Genetic variability, validation, high temperature stress tolerant rice, yield related traits, SSR markers